Hallo und Hi,
ich weiß nicht, ob das hier das richtige Forum ist, aber da ich nicht in vielen Foren angemeldet bin,
probier ich es hier einfach mal.
Und zwar, ich habe mir 2 neue Festplatten gekauft, und auch gleich fleißig mein System von "normalen" Debian Wheezy auf OpenMediaVault geändert (also, im Grunde nicht viel dran verändert, normales Debian durech ein gleiches Debian ersetzt *grins*)
Sodele, zu meinem Problem, ich habe unter OpenMediaVault die SMART Berichte eingeschaltet.
Das System einen Tag laufen lassen, und heute mal, da ich es einfach vermisst habe, Webmin installiert.
(Schönere Graphen und CPU Temperaturen...)
Prompt habe ich im Willkommens-Screen "SMART Fehler". (siehe Bild)
Also, erst mal Panik geschobeben, SDA und SDB sind die zwei neuen Platten.
SDC und SDD liefen seit rund 8 Monate unter meinem normalen Wheezy ohne Fehleranzeige im SMART.
Der genauere Bericht von SDA lautet:
Kurzer SMART Bericht
Ort SATA Gerät B Festplattengröße 5.59 TB
Marke und Modell ATA WDC WD60EZRX-11M Unterstützt SMART? Ja
SMART eingeschaltet? Ja
Gespeicherte Fehler 6 Fehler erfasst
Festplattentest durchgeführt? Ja
Modell-Familie Western Digital Green
Marke und Modell WDC WD60EZRX-11MVLB1
Seriennummer WD-xxxxxxxxxxxxxxx
Kapazität 6,001,141,572,096 bytes [6.00 TB]
Offline data collection status Offline data collection activity was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status The previous self-test routine completed without error or no self-test has ever been run.
Total time to complete Offline data collection 5564 seconds.
Offline data collection capabilities SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities Saves SMART data before entering power-saving mode.
Supports SMART auto save timer.
Error logging capability Error logging supported.
General Purpose Logging supported.
Short self-test routine recommended polling time 2 minutes.
Extended self-test routine recommended polling time 255 minutes.
Conveyance self-test routine recommended polling time 5 minutes.
SCT capabilities SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
| Raw Read Error Rate |
| Spin Up Time |
| Start Stop Count |
| Reallocated Sector Ct |
| Seek Error Rate |
| Power On Hours |
| Spin Retry Count |
| Calibration Retry Count |
| Power Cycle Count |
| Power-Off Retract Count |
| Load Cycle Count |
| Temperature Celsius |
| Reallocated Event Count |
| Current Pending Sector |
| Offline Uncorrectable |
| Multi Zone Error Rate |
Ausführlicher Bericht
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Green
Device Model: WDC WD60EZRX-11MVLB1
Serial Number: WD-xxxxxxxxxxxxxxxxxxx
LU WWN Device Id: 5 0014ee xxxxxxxxxxxxx
Firmware Version: 80.00A80
User Capacity: 6,001,141,572,096 bytes [6.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 9
ATA Standard is: Not recognized. Minor revision code: 0x001f
Local Time is: Sun Nov 15 14:44:10 2015 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5564) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 196 195 021 Pre-fail Always - 9166
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 17
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 100 253 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 51
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 17
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 5
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 439
194 Temperature_Celsius 0x0022 119 114 000 Old_age Always - 33
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 6 (device [definition='1','0']log[/definition] contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 6 occurred at disk power-on lifetime: 29 hours (1 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 02:17:22.359 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 02:17:22.359 SMART READ LOG
b0 d5 01 e0 4f c2 00 08 02:17:22.359 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 02:17:22.358 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 02:17:22.357 SMART WRITE LOG
Error 5 occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 06:21:36.200 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 06:21:36.200 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 06:21:36.199 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 06:21:36.198 SMART WRITE LOG
Error 4 occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 06:21:36.200 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 06:21:36.199 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 06:21:36.198 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 06:21:36.197 SMART WRITE LOG
Error 3 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 01:48:36.263 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 01:48:36.263 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 01:48:36.262 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 01:48:36.261 SMART WRITE LOG
Error 2 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 01:48:36.260 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 01:48:36.260 SMART READ LOG
b0 d5 01 09 4f c2 00 08 01:48:36.260 SMART READ LOG
b0 d5 01 09 4f c2 00 08 01:48:36.260 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 01:48:36.259 SMART WRITE LOG
SMART Self-test [definition='1','0']log[/definition] structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 49 -
SMART Selective self-test [definition='1','0']log[/definition] data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Mit meinen, mehr oder minder schlechten englisch Kenntnissen heißen die Fehler lediglich, dass eine SMART Operation durchgeführt wurde (Abfrage irgendwelche Werte), während das Gerät einfach nicht Bereit war.
Jetzt, wie bekomme ich diese hässlichen Fehler wieder auf 0 gesetzt, damit diese in der Übersicht / Willkommensmeldung von Webmin verschwinden?
Grüße
Acid
